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[1997] Evidence for Diffuse Interfaces and Tensile in-plane Strains in Evaporated Co/Pd (111) Multilayers and their Role in Perpendicular Magnetic Anisotropy
Evidence for Diffuse Interfaces and Tensile in-plane Strains in  Evaporated Co/Pd (111) Multilayers and their Role in Perpendicular Magnetic Anisotropy
S.-K. Kim, V. A. Chernov, and Y. M. Koo
J. Magn. Magn. Mater. 170  L7 (1997. 2)
hit : 1140
[1997] Soft x-ray circular polarizer using magnetic circular dichroism at the Fe
Soft x-ray circular polarizer using magnetic circular dichroism at the Fe L3 line
J. B. Kortright, S.-K. Kim, T. Warwick, and N. V. Smith
Appl. Phys. Lett.  71, 1446 (1997. 9)
hit : 2987
[1997] Anisotropic short-range structure of Co0.16 Pd0.84 alloy films having perpendicular magnetic anisotropy
Anisotropic short-range structure of Co0.16 Pd0.84 alloy films having perpendicular magnetic anisotropy
S. -K. Kim, V. A. Chernov, J. B. Kortright, and Y. M. Koo
Appl. Phys. Lett. 71, 66 (1997. 7. 7)
hit : 1705
[1996] Atomic Force Microscopy Study of Kinetic Roughening for Co/Pd Multilayered Films with Pd Underlayers
Atomic Force Microscopy Study of Kinetic Roughening for Co/Pd Multilayered Films with Pd Underlayers
I. B. Chung, S.-K. Kim, Y. M. Koo, J. S. Kang, J. H. Hong, and J. I. Jeong
Sae Mulli 36,  584 (1996)
hit : 1010
[1996]Clear evidence for strain changes according to Co layer thickness in metastable Co/Pd(111) multilayers : An Extended
Clear evidence for strain changes according to Co layer thickness in metastable Co/Pd(111) multilayers : An Extended X-ray Absorption Fine Structure study

S.-K. Kim, Y. M. Koo, V. A. Chernov, and H. Padmore

Phys. Rev. B VOLUME 53, NUMBER 16 15 APRIL 1996
hit : 2820
[1992] Dependence of the magnetic properties of Co/Pd multilayered films on the structural parameters estimated accurately by x-ray diffraction
Dependence of the magnetic properties of Co/Pd multilayered films on the structural parameters estimated accurately by x-ray diffraction
S.-K. Kim, J. S. Kang, J. I. Jeong, J. H. Hong, Y. M. Koo, H. J. Shin, and Y. P. Lee
J. Appl.  Phys. 72, 4986 (1992)
hit : 1296
[1993]Electron Yield XAFS Study of Evaporated Co/Pd Multilayers with Various Thickness Ratios of Co to Pd Sublayers:
Electron Yield XAFS Study of Evaporated Co/Pd Multilayers with Various Thickness Ratios of Co to Pd Sublayers:
Simulations of the Co K-edge XAFS and Fourier Transforms
M. Choi, J. H. Joo, S.-K. Kim, J. S. Kang, Y. P. Lee, S. -C. Shin, and S. M. Heald
Jpn. J. Appl. Phy. 32-2, 410 (1993)
hit : 1543
[1993]Valence Band Photoemission Study of Co/Pd multilayer
Valence Band Photoemission Study of Co/Pd multilayer
J.-S. Kang, S.-K. Kim, J. I. Jeong, J. H. Hong, Y. P. Lee, H. J. Shin, and C. G. Olson
J. Korean Magnetic Society, 3 (1), 48 (1993)
hit : 1882
[1993]Magnetic properties of Co/Pd multilayers prepared by UHV physical vapor deposition
Magnetic properties of Co/Pd multilayers prepared by UHV physical vapor deposition
Y. P. Lee, S.-K. Kim, J. S. Kang, Y. M. Koo, J. I. Jeong, J. H. Hong,  and H. J. Shin
J. Magn. Magn. Mater. 126, 316 (1993)
hit : 0
[1994]Improved determination of the ultrathin structural parameters of Co/Pd multilayered film, and its magnetic and magneto-optical property
Improved determination of the ultrathin structural parameters of Co/Pd multilayered film, and its magnetic and magneto-optical properties
Y. P. Lee, S.-K. Kim, J. S. Kang, J. I. Jeong, J. H. Hong, Y. M. Koo, and H. J. Shin
J. Vac. Sci. & Tech., A 12(5), 2672, (1994)
hit : 1390
[1995]Origin of unknown x-ray diffraction peaks from incommensurate superlattices
Origin of unknown x-ray diffraction peaks from incommensurate superlattices
S.-K. Kim, C. H. Chang, Y. P. Lee, Y. M. Koo
J. Appl.  Phys.  77, 423 (1995),
hit : 4143
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